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Structure Characterization

Structure characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. During the past 100 years, numerous useful characterization techniques have been developed and practiced, which have come into play at many phases of the product design and manufacturing process. Whether you choose materials for new product development, concept validation and prototyping tests, qualification of first production batches or test batches, or try to determine the cause of failure, structural characterization is inevitable.

BOC Sciences has a wealth of experience in structure characterization, and we can provide varieties of advanced structure characterization techniques as you want.

Here are some common structure characterization techniques:

  • Scanning electron microscope (SEM)

SEM, which can achieve resolution better than 1 nanometer, is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition.

  • Atomic force microscopy (AFM)

AFM is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning.

  • Fourier-transform infrared spectroscopy (FTIR)

FTIR is a technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid or gas. An FTIR spectrometer simultaneously collects high-spectral-resolution data over a wide spectral range. This confers a significant advantage over a dispersive spectrometer, which measures intensity over a narrow range of wavelengths at a time.

  • X-ray diffraction (XRD)

X-ray crystallography is a technique used for determining the atomic and molecular structure of a crystal, in which the crystalline atoms cause a beam of incident X-rays to diffract into many specific directions. By measuring the angles and intensities of these diffracted beams, a crystallographer can produce a three-dimensional picture of the electron density within the crystal. From this electron density, the average positions of the atoms in the crystal can be determined, as well as their chemical bonds, disorder, and various other information.

  • Ultraviolet-visible spectroscopy (UV-vis)

UV-vis refers to the absorption or reflection spectrum in the ultraviolet-visible spectral region. This means it uses visible light and adjacent ranges of light. The wavelength of the absorption peak can be related to the type of bond in a given molecule and is valuable for determining functional groups within the molecule. In fact, there are many techniques that can be used for structural characterization.

BOC Sciences can provide structure characterization with high quality and short period. Our experts and analysts have rich experience and intimate knowledge of analytical process. We are glad to hear from you and we’re looking forward to working with you.

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